Non-destructive elemental analysis for sodium (Na) to uranium (U)
Quick elemental analyses of solids, liquids, powders, coatings, and thin films
Indirect excitation for exceptionally low detection limits
High-power 50 kV 50 W X-ray tube
Large-area high-throughput silicon drift detector (SDD)
Analysis in air, helium, or vacuum
Powerful and easy to use QuantEZ¨ software with multilingual user interface
Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP
Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
Various automatic sample changers accommodating up to 52 mm samples
Low cost of ownership backed by a 2-year warranty

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