Rigaku NEX CG II
Rigaku NEX CG II is an advanced EDXRF spectrometer for unparalleled non-destructive elemental analysis with exceptional sensitivity using polarised X-Rays.
Product Overview
The Rigaku NEX CG II EDXRF Spectrometer sets new standards in material analysis. Utilising Cartesian Geometry XRF analysis technology, it delivers unmatched accuracy, sensitivity, and non-destructive testing across a broad spectrum of elements, from trace levels to major constituents.
Designed for diverse applications, including environmental monitoring, quality control, and research and development, the NEX CG II provides rapid, reliable results for both solids and liquids with minimal sample preparation.
Features & Benefits
Enhanced Sensitivity and Precision
Preserves Sample Integrity
Accurate Wide Elemental Range
Key applications
- Cartesian Geometry XRF optics: Offers enhanced sensitivity and precision.
- Advanced RPF-SQX Software: Simplifies complex analyses with accurate results.
- High-Precision EDXRF Technology: Delivers accurate quantification across a wide elemental range.
- Multi-Element Analyzer: Capable of simultaneous detection of multiple elements
Rigaku NEX CG II Product Video
About the Rigaku NEX CG II
NEX CG II, performs elemental analysis of major, minor and trace elements from light elements – Na to heavy U.
Measurements can be made of metals, glass and other solid matrices, powders of soils, geological matrices, polymers, pharmaceuticals and other powders, liquids, pastes, waste materials, thin films and coatings and any material that can be presented to the instrument in pre-defined cups or discs or any free form objects.
The NEX CG II is a powerful analytical tool that benefits from the following key features:
- Fast elemental analysis to measure Na to U
- Non-Destructive measurements
- Accommodates sample matrices of solids, liquids and powders with often minimal sample preparation.
- Advanced QuantEZ® software for ease of use.
- Proven high performance Standardless RPF-SQX Fundamentals Parameters software with ability to estimate light elements matrix (H to F) featuring Scattering FP to measure light matrices without the need for standards
- Built in analysis templates to cover all main applications enhancing the flexibility and ease of use/setup of the instrument.
- Cartesian geometry optics to give superior elimination of background especially from light matrices enhancing detection limits.
- 50kV/50 W High power x-ray tube with large area SDD (Silicon Drift Detector) offering optimised energy setting for latest high count-rate detectors providing best detection limits of instrument in its class.
- Combining improved resolution from latest detector technology to enhance peak deconvolution using Rigaku Profile Fitting (RPF) advanced algorithms.
- Options for Air, Helium or Vacuum atmospheres to suit all needs.
- Variety of sample handler configurations up to 52mm diameter including 15 and 10 position trays and spinners options
- Performance and build quality backed with 2-year warranty.
- Special “Ultra Carry” option for ppb detection limits in aqueous samples
Polarized X-ray optics using 3D Cartesian Geometry (CG)
The prime reason for applying a Cartesian Geometry and therefore polarising the optics is to eliminate the spectral background caused by back scattered X-rays. Just as polarised lenses in sunglasses remove the glare from the sun reflections, so polarized x-rays from the 3D configuration no longer back-scatter into the detector.
This leads to up to 10 times more sensitive analysis and therefore sub ppm LOD’s rather than low ppm. The NEX CG II uses new designed close-coupled Cartesian Geometry (CG) to improve the performance of the detection limits for both light and heavy element range ranges.
"The Rigaku NEX CG II redefines EDXRF with its exceptional sensitivity and versatility,
making it ideal for trace element analysis in a wide range of materials."
Product FAQ's
Suitable for environmental monitoring, quality control, research and development, and more, due to its wide elemental coverage and high sensitivity.
Yes, it’s designed for the analysis of solids, liquids, and even thin films, offering versatile sample handling.
It increases the sensitivity and precision of the analysis, allowing for lower detection limits and faster results.
Its combination of non-destructive testing, advanced software, and high precision across a broad elemental range sets it apart.
Absolutely, with the QuantEZ software and RPF-SQX algorithms, it offers a simplified user interface for complex analyses.
Applications
Application Note 1
Application Note 2
Application Note 3
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