CIQTEK SEM2000
Advanced Tungsten Filament Scanning Electron Microscope
Product Overview
The CIQTEK SEM2000 stands out as a versatile analytical tungsten filament scanning electron microscope. Designed for precision, it boasts a resolution of up to 3.9 nm at 20 kV, with an option to upgrade to 30 kV. This advanced electron microscopy tool is perfect for observing microstructural details of sub-microscale samples.
Beyond its core functionality, the SEM2000 offers a larger motion range than typical desktop SEMs, making it ideal for rapid sample screening. Additionally, its expandability with interfaces for BSED, EDS/EDX, and other accessories ensures a broader application spectrum.
Features & Benefits
User-Friendly:
One-click imaging.
High-End Resolution:
3.9 nm @ 20 kV clarity.
Dual Imaging:
SE and BSE modes.
Key Features
- High Resolution: Achieve 3.9 nm @ 20 kV, ensuring detailed imaging.
- Extended Scalability: Compatibility with BSED, EDS/EDX, and more.
- Advanced Automation: Features like auto brightness, contrast, and autofocus.
- Optical Navigation: High-definition sample stage photos for quick positioning.
- Anti-collision Design: Ensures maximum protection of sensitive components.
- One-Click Imaging: Simplified user interface for quick imaging.
- Simultaneous Imaging: Switch between SE and BSE for comprehensive sample information.
About the CIQTEK SEM2000
Introducing the CIQTEK SEM2000, a state-of-the-art Tungsten Filament Scanning Electron Microscope designed to revolutionize the realm of microstructural analysis. In today’s fast-paced scientific world, there’s a pressing need for accurate, detailed, and rapid microstructural observations.
The SEM2000 addresses this by offering unparalleled resolution, ensuring that even the minutest details are not missed. Its standout features, such as the advanced automation functions and the optical navigation system, not only enhance its performance but also make it user-friendly.
Whether you’re a seasoned researcher or a novice, the SEM2000 ensures that you can get started with ease, thanks to its intuitive interface. Moreover, its anti-collision design guarantees the safety of its sensitive components, ensuring longevity and reliability.
But what truly sets the SEM2000 apart is its ability to provide both morphological and compositional information of the sample simultaneously, a feature that’s crucial for comprehensive sample analysis. In essence, the CIQTEK SEM2000 is not just a product; it’s a solution to the pressing challenges faced by researchers and professionals in the field of microstructural analysis.
Versatile tungsten filament SEM2000
for advanced microstructural analysis
Hightlights
Optical Navigation Simplified
Effortlessly explore your desired areas by simply clicking where you want to go.
A High-Definition Standard
Utilize our standard optical navigation camera for capturing high-definition sample stage photos and achieving rapid sample positioning.
Effortless Image Capture
Our software boasts a user-friendly interface that allows for easy operation with just a single click to capture images.
Enhanced Anti-Collision Safety
We’ve implemented a user-friendly anti-collision system with a focus on novice-friendliness, ensuring maximum protection for delicate components.
Optimal Working Distance
Our system seamlessly combines the optimal analysis distance and image distance into one, providing a unified solution for experiencing high-quality performance with ease.
Product FAQ's
The SEM2000 offers a resolution of 3.9 nm at 20 kV.
Absolutely! Its user-friendly interface ensures even beginners can start quickly.
Yes, it supports one-click switching between SE and BSE for comprehensive sample insights.
It boasts a novice-friendly anti-collision design for maximum component protection
Yes, there’s an option to upgrade to 30 kV.
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