Bowman G Series XRF
Revolutionise your metal finishing and materials analysis with the compact and versatile Bowman G Series XRF, featuring advanced precision and versatility for unparalleled plating thickness analysis.
Product Overview
The Bowman G Series XRF stands at the forefront of XRF technology, offering unparalleled precision in elemental analysis.
Designed for a wide range of applications, from jewellery assessment to RoHS compliance verification, this benchtop XRF instrument combines high-resolution detection, micro-focus X-ray tubes, and motorised Z-axis control to deliver accurate, repeatable results.
Its compact design does not compromise on performance, making it an ideal choice for laboratories, manufacturing environments, and quality control processes seeking reliable and efficient elemental analysis for metal finishes, plating bath solutions, and other applications.
Features & Benefits
Precision Imaging
High-Resolution Detection
Adaptable Focus
Motorized Z-Axis Control
Future-Proof
Easily Upgradeable Systems
Compliance Ready
RoHS and IPC Standards
Key features of Bowman G Series XRF
- High-Resolution SDD Detector: Ensures detailed and precise analysis for accurate results.
- Motorized Z-Axis XRF with laser autofocus: Provides adjustable and automated focus for varying sample sizes and types.
- Small footprint: Its non-imposing size is ideal for a variety of working environments.
- Upgradeable XRF Systems: Allows for future enhancements, ensuring longevity and adaptability.
- Comprehensive Compliance: Meets RoHS, IPC standards, and more for global application.
Bowman G Series XRF Product Video
About the Bowman G Series XRF
Introducing the Bowman G Series XRF, a pinnacle of XRF technology designed to meet the diverse needs of elemental analysis across various industries. This benchtop marvel addresses the critical demand for precise, reliable, and versatile material analysis, from precious metals in jewellery to compliance verification in manufactured goods.
The G Series excels in delivering detailed insights into material composition, leveraging its high-resolution XRF detector and micro-focus X-ray tube to provide unparalleled accuracy.
The motorized Z-axis enhances the instrument’s flexibility, accommodating samples of varying sizes with ease, while its compact design ensures it fits seamlessly into any workspace.
Designed with the future in mind, the G Series is upgradeable, allowing for technological advancements to be integrated (i.e., multiple collimator sizes, variable focus camera etc), extending its utility and value over time. Its comprehensive compliance capabilities, including RoHS and IPC standards, make it an essential tool for industries aiming to meet stringent regulatory requirements.
The Bowman G Series XRF not only solves the challenge of achieving precise elemental analysis but does so with an efficiency and adaptability that sets a new standard in the field.
Product Specifications
Element Range | Aluminium 13 to Uranium 92 |
X-ray Excitation | 50 W (50kV and 1mA) micro-focused W anode tube |
Detector | Silicon solid state detector with 190eV resolution or better |
Number of Analysis Layers and Elements | 5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 25 elements simultaneously |
Filters/Collimators | 4 primary filters / single collimator (optional dual) |
Focal Depths | Single fixed focal depth with laser and auto focus |
Digital Pulse Processing | 4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction |
Computer | Intel, CORE i5 3470 Processor (3.2GHz), 8GB DDR3 Memory, Microsoft Windows 10 Prof, 64-bit equivalent |
Camera Optics | 1/4″ (6mm) CMOS-1280×720 VGA resolution |
Video Magnification | 30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional |
Power Supply | 150W, 100-240 volts, with frequency range of 47Hz to 63Hz |
Weight | 25kg |
Standard Motorized/Programmable XY | Table size: Not available |
Extended Programmable XY | Table size: Not available |
Optional Manual XY Sample Stage | Table size: 279mm (11″) x 254mm (10″) Travel: 38mm (1.5″) x 38mm (1.5″) |
Internal Dimensions | Height: 100mm (4″), Width: 325mm (13″), Depth: 300mm (12″) |
External Dimensions | Height: 325mm (13″), Width: 350mm (14″), Depth: 450mm (18″) |
"The Bowman G Series sets the standard for XRF coating thickness measurement, offering unparalleled accuracy and versatility for precise surface analysis"
Product FAQ's
Absolutely, it’s designed with precision video imaging and high-resolution detectors, making it ideal for XRF technology for precious metals analysis.
Yes, the micro-focus X-ray tube and motorized Z-axis make it perfect for small sample XRF analysis, providing detailed and accurate results.
Indeed, the Bowman G Series XRF features upgradeable systems, ensuring it remains at the cutting edge of XRF technology.
It’s equipped with advanced XRF coating measurement technology and elemental analysis capabilities, ensuring full compliance with RoHS and IPC standards.
Yes, it’s specifically designed for precise elemental analysis, making it ideal for XRF for connectors and fasteners among other applications.
Applications
Application Note 1
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