Bowman B Series XRF
Discover Bowman B Series XRF, a top-down measurement solution for accurate and budget-friendly XRF analysis.
Product Overview
The B Series XRF is Bowman’s entry level top-down measurement system.
It features a fixed sample stage for manual positioning of samples, single diameter fixed collimator and fixed focal distance as standard. It retains the slotted chamber design of the P Series, ideal for measurement of PCBs, and a high-resolution silicon drift detector.
The Bowman B Series is ideally suited to low testing volumes, larger finished parts with curved or profiled shapes, and large PCBs requiring simple spot checks.
Features & Benefits
Spacious sample chamber
140mm (H) x 310mm (W) x 335mm (D) sample capacity
High resolution camera
30x magnification camera for precise sample positioning
SDD detector as standard
High-resolution detector means futureproof analytical performance
Key features for Bowman B Series XRF
- Top-down measurement configuration: ensures accurate and consistent measurements on large or profiled parts.
- High-resolution SDD detector: capable of handling the most demanding coating applications.
- Micro-focus X-ray tube: offers enhanced excitation intensity for faster measurement.
- PCB industry standard compliance: Guaranteed to comply with IPC-4552, 4553, 4554 and 4556.
- Plating industry compliance: Meets requirements of DIN EN ISO 3497 and ASTM B568.
- Wide element range: Aluminium (Al) – uranium (U) analysis range.
- Budget-friendly performance: fixed sample stage, fixed collimator and fixed focal distance offer a budget-friendly solution for low throughput applications.
- Upgradeable: Upgradeable to multiple collimators and variable focal distances. Large-area SDD available for special applications.
- Designed and manufactured in the USA: Trusted quality and origin.
Bowman B Series XRF Product Video
About the Bowman B Series XRF
In the demanding field of coating thickness measurement, the need for precise, reliable, and budget-friendly solutions has never been greater.
The Bowman B Series XRF provides just that: an entry point into top-down chamber configuration and the measurement flexibility that it offers, at an affordable price, and with no compromises on analytical performance.
The top-down chamber configuration allows more flexibility in positioning and measuring larger or profiled parts than with optics below. Whilst the fixed sample stage requires manual sample positioning, the standard high-resolution 30x magnification camera and laser auto-focus system mean that this process is still simple and fast. The standard fixed 0.3mm collimator and fixed focal distance offer a “no-frills” specification for applications where more complex features are simply not required. However, that does not mean the B Series compromises on quality or analytical performance. It comes as standard with the same long life micro-focus X-ray tube, high resolution SDD detector and Bowman Archer software platform found in higher-specification systems, which means that the B Series is capable of handling the most demanding of coating applications including complex multi-layer coatings. What’s more, the fixed collimator and fixed focal distance are both optionally upgradeable to provide that extra level of flexibility if required.
The Bowman B Series XRF is not just a product; it’s a comprehensive solution. With guaranteed compliance to PCB industry standards IPC-4552, 4553, 4554, and 4556, as well as compliance with general metal coating standards ASTM B568 and DIN EN ISO 3497, it stands as a testament to quality and reliability. Whether it’s spot checks on large PCBs, coating measurements on larger finished parts such as plumbing fittings or automotive components, or low-volume measurements on any plated parts, the Bowman B Series has it covered. Made in the USA, it ensures a level of quality and performance that sets it apart in the market.
Product Specifications
Element Range: | Aluminium 13 to Uranium 92 |
X-ray excitation: | 50 W (50kV and 1mA) micro-focused W anode tube |
Detector: | Silicon solid state detector with 190eV resolution or better |
Number of analysis | 5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 25 elements simultaneously |
Filters/Collimators: | 4 primary filters/single motorized collimators |
Focal Depths: | Fixed focal depths with laser (optional multi focal) |
Digital Pulse Processing: | 4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction |
Computer: | Intel, CORE i5 3470 Processor (3.2GHz), 8GB DDR3 Memory, Microsoft Windows 10 Prof, 64-bit equivalent |
Camera optics: | 1/4″ (6mm) CMOS-1280×720 VGA resolution |
Video Magnification: | 30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional |
Power Supply: | 150W, 100-240 volts, with frequency range of 47Hz to 63Hz |
Weight: | 34kg |
Standard Motorized/ Programmable XY: | Table size: Not available |
Extended Programmable XY: | Table size: Not available |
Internal Dimensions: | Height: 140mm (5.5″), Width: 310mm (12″), Depth: 335mm (13″) |
External Dimensions: | Height: 450mm (18″), Width: 450mm (18″), Depth: 600mm ( 24″) |
"The B Series provides an entry point into flexible top-down XRF
measurement at a budget-friendly price"
Product FAQ's
The combination of top-down measurement configuration, close-coupled optics, high-resolution SDD detector and budget-friendly price make the Bowman B Series unique.
Yes, it offers an ideal solution for low-volume testing requirements.
Yes, the fixed collimator, fixed focal distance and detector can all be upgraded to fit your specific requirements.
It complies with IPC-4552, 4553, 4554, and 4556, as well as ASTM B568, and DIN EN ISO 3497 XRF standards.
The Bowman B Series XRF equipment is made in the USA
Applications
Application Note 1
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